2022.03.03
2022.3.3 M. Ohbitsu, T. Yokoi, Y. N…
2022.3.3 M. Ohbitsu, T. Yokoi, Y. Noda, E. Kamiyama, T. Ushiro, H. Nagaoka, K. Sueoka, K. Matsunaga, Atomic structures and stability of finite-size extended interstitial defects in silicon: Large-scale molecular simulations with a neural-network potential, Scripta Materialia, 214 (2022) 114650. (https://doi.org/10.1016/j.scriptamat.2022.114650)