2022.08.01
2022.08.01 Satoko Toyama, Takehito …
2022.08.01
Satoko Toyama, Takehito Seki, Yuya Kanitani, Yoshihiro Kudo, Shigetaka Tomiya, Yuichi Ikuhara, Naoya Shibata, Quantitative electric field mapping in semiconductor heterostructures via tilt-scan averaged DPC STEM, Ultramicroscopy, 238 (2022) 113538. ( https://doi.org/10.1016/j.ultramic.2022.113538)