2021.01.15
2021.01.15 D. Morikawa, M. Ageishi…
2021.01.15
D. Morikawa, M. Ageishi, K. Sato, K. Tsuda, and M. Terauchi, “Evaluation of TEM Specimen Quality Prepared by Focused-Ion-Beam Using Symmetry Breaking Index of Convergent-Beam Electron Diffraction”, Microscopy, doi: 10.1093/jmicro/dfab002 (2021).