2020.07.15
2020.07.15 K. Nakazawa, K. Shibata…
2020.07.15
K. Nakazawa, K. Shibata, K. Mitsuishi, S. Amma, and T. Mizoguchi*, Local thickness and composition measurements from scanning convergent-beam electron diffraction of a binary non-crystalline material obtained by a pixelated detector, Ultramicroscopy, 217, 113077-1-8, July. 2020. (DOI: 10.1016/j.ultramic.2020.113077)